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DesignCon Mini Tour Highlights USB Type-C, Power, and Memory Test

January 18, 2016

If you’re heading to DesignCon next week, you should take a quick dip into Keysight’s booth to catch up on at least four topics of real import in high-speed design and test, and what to do about it.

I got a quick preview earlier this week: from USB Type-C and signal and power integrity, to PAM-4, 100G/400G data center standards and test and validation of the latest PCIe and DDR/LPDDR memory interface standards, it’s all there.

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